Standard Guide for Handling Specimens Prior to Surface Analysis
€65.00
Standard Practice for Tissue Cryosection Analysis with SIMS
€58.00
Standard Guide for Cell Culture Analysis with SIMS
Standard Guide to Scanner and Tip Related Artifacts in Scanning Tunneling Microscopy and Atomic Force Microscopy
€72.00
Standard Guide for Selection of Calibrations Needed for X-ray Photoelectron Spectroscopy (XPS) Experiments
Standard Guide for Minimizing Unwanted Electron Beam Effects in Auger Electron Spectroscopy
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Standard Practice for Reporting Data in Auger Electron Spectroscopy and X-ray Photoelectron Spectroscopy
Standard Practice for Identifying Elements by the Peaks in Auger Electron Spectroscopy (Withdrawn 2017)
Standard Guide for Interpretation of Mass Spectral Data Acquired with Time-of-Flight Secondary Ion Mass Spectroscopy (Withdrawn 2018)
Standard Practice for Analytically Describing Depth-Profile and Linescan-Profile Data by an Extended Logistic Function (Withdrawn 2019)
Standard Guide for Reporting of Ion Beam Parameters Used in Surface Analysis (Withdrawn 2020)
Standard Guide for Depth Profiling in Auger Electron Spectroscopy
Standard Guide to Charge Control and Charge Referencing Techniques in X-Ray Photoelectron Spectroscopy
Standard Guide for Determining SIMS Relative Sensitivity Factors from Ion Implanted External Standards (Withdrawn 2010)
Standard Practice for Measuring and Reporting Probe Tip Shape in Scanning Probe Microscopy (Withdrawn 2016)
