19.100 : Non-destructive testing

ASTM E1390-12(2016)

ASTM E1390-12(2016)

Superseded Historical

Standard Specification for Illuminators Used for Viewing Industrial Radiographs

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ASTM E801-16

ASTM E801-16

Superseded Historical

Standard Practice for Controlling Quality of Radiographic Examination of Electronic Devices

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ASTM E3081-16

ASTM E3081-16

Superseded Historical

Standard Practice for Outlier Screening Using Process Compensated Resonance Testing via Swept Sine Input for Metallic and Non-Metallic Parts

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ASTM E1001-16

ASTM E1001-16

Superseded Historical

Standard Practice for Detection and Evaluation of Discontinuities by the Immersed Pulse-Echo Ultrasonic Method Using Longitudinal Waves

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ASTM E1316-17

ASTM E1316-17

Superseded Historical

Standard Terminology for Nondestructive Examinations

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ASTM E1316-17a

ASTM E1316-17a

Superseded Historical

Standard Terminology for Nondestructive Examinations

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ASTM E1316-19b

ASTM E1316-19b

Superseded Historical

Standard Terminology for Nondestructive Examinations

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ASTM E1316-20

ASTM E1316-20

Superseded Historical

Standard Terminology for Nondestructive Examinations

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ASTM E3168-20

ASTM E3168-20

Superseded Historical

Standard Practice for Determining Low-Contrast Visual Acuity of Radiographic Interpreters

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ASTM E1316-20a

ASTM E1316-20a

Superseded Historical

Standard Terminology for Nondestructive Examinations

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ASTM D6874-20

ASTM D6874-20

Superseded Historical

Standard Test Methods for Nondestructive Evaluation of the Stiffness of Wood and Wood-Based Materials Using Transverse Vibration or Stress Wave Propagation

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ASTM E1316-21

ASTM E1316-21

Superseded Historical

Standard Terminology for Nondestructive Examinations

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ASTM E1316-21a

ASTM E1316-21a

Superseded Historical

Standard Terminology for Nondestructive Examinations

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ASTM E1316-21b

ASTM E1316-21b

Superseded Historical

Standard Terminology for Nondestructive Examinations

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ASTM E801-91(1995)e1

ASTM E801-91(1995)e1

Superseded Historical

Standard Practice for Controlling Quality of Radiological Examination of Electronic Devices

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