31.120 : Electronic display devices

DIN IEC 61988-3:2003-02

DIN IEC 61988-3:2003-02

Superseded Historical

Plasma display panels - Part 3: Guidelines of mechanical interface (IEC 47C/284/CD:2002)

€63.27

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DIN IEC 61747-2-2:2002-11

DIN IEC 61747-2-2:2002-11

Superseded Historical

Liquid crystal and solid-state display devices - Part 2-2: Matrix colour LCD modules; Blank detail specification (IEC 47C/274/CD:2002)

€69.91

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ASTM E986-04(2017)

ASTM E986-04(2017)

Superseded Historical

Standard Practice for Scanning Electron Microscope Beam Size Characterization

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ASTM D5138-16

ASTM D5138-16

Superseded Historical

Standard Classification System and Basis for Specification for Liquid Crystal Polymers Molding and Extrusion Materials (LCP)

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ASTM F1709-97

ASTM F1709-97

Superseded Historical

Standard Specification for High Purity Titanium Sputtering Targets for Electronic Thin Film Applications

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ASTM D5138-99a

ASTM D5138-99a

Superseded Historical

Standard Specification for Liquid Crystal Polymers

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ASTM E986-97

ASTM E986-97

Superseded Historical

Standard Practice for Scanning Electron Microscope Beam Size Characterization

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ASTM D5138-06

ASTM D5138-06

Superseded Historical

Standard Classification System for Liquid Crystal Polymers (LCP)

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ASTM E986-04

ASTM E986-04

Superseded Historical

Standard Practice for Scanning Electron Microscope Beam Size Characterization

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ASTM D5138-11

ASTM D5138-11

Superseded Historical

Standard Classification System and Basis for Specification for Liquid Crystal Polymers Molding and Extrusion Materials (LCP)

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ASTM F1709-97(2008)

ASTM F1709-97(2008)

Superseded Historical

Standard Specification for High Purity Titanium Sputtering Targets for Electronic Thin Film Applications

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ASTM F1711-96(2008)

ASTM F1711-96(2008)

Superseded Historical

Standard Practice for Measuring Sheet Resistance of Thin Film Conductors for Flat Panel Display Manufacturing Using a Four-Point Probe Method

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ASTM F1844-97(2008)

ASTM F1844-97(2008)

Superseded Historical

Standard Practice for Measuring Sheet Resistance of Thin Film Conductors For Flat Panel Display Manufacturing Using a Noncontact Eddy Current Gage

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ASTM E986-04(2010)

ASTM E986-04(2010)

Superseded Historical

Standard Practice for Scanning Electron Microscope Beam Size Characterization

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ASTM F1711-96(2002)

ASTM F1711-96(2002)

Superseded Historical

Standard Practice for Measuring Sheet Resistance of Thin Film Conductors for Flat Panel Display Manufacturing Using a Four-Point Probe

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