Advanced library format (ALF) describing integrated circuit (IC) technology, cells and blocks
€404.00
Integrated circuits. EMC evaluation of CAN transceivers
€355.00
Electricity metering. Data exchange for meter reading, tariff and load control Use of local area networks on twisted pair with carrier signalling
Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz General conditions and definitions
€269.00
Semiconductor devices. Discrete devices Microwave diodes and transistors. field effect Blank detail specification BDS for microwave field-effect transistors
€193.00
Parameter extraction techniques for the European mini test chip
Measurement techniques for the characterization of the European mini test chip
Description of a parametrized European mini test chip
Description of the reliability test structures of the European mini test chip
€316.00
JESSI 0.8 µm CMOS transistor model for analogue and digital circuit simulation
Specification for integrated electronic circuits and micro-assemblies of assessed quality (capability approval procedures). Generic data and methods of test
Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for film and hybrid integrated circuits: qualification approval
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Film and hybrid integrated circuits: qualification approval procedure
Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for film integrated circuits and hybrid film integrated circuits: capability approval
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Film and hybrid integrated circuits: capability approval
