Integrated optics - Vocabulary - Part 2: Terms used in classification (ISO 11807-2:2001)
€63.27
Optics and optical instruments - Preparation of drawings for optical elements and systems - Part 17: Laser irradiation damage threshold (ISO/DIS 10110-17:2002)
€56.17
Lasers and laser-related equipment - Test methods for laser beam widths, divergence angles and beam propagation ratio - Part 1: Stigmatic and simple astigmatic beams (ISO/DIS 11146-1:2003); German version prEN ISO 11146-1:2003
€91.03
Semiconductor devices; optoelectronic devices; terminologie; identical with IEC 47(Central Office)1284
€34.30
Semiconductor devices; avalanche photodiodes (APD); measuring method; identical with IEC 47(Central Office)1040
Semiconductor devices; discrete devices and integrated circuits; optoelectronic devices; identical with IEC 60747-5:1984.
€84.58
Semiconductor devices; measuring method for radiant power or forward current of LEDs, IREDs and laser diodes; identical with IEC 47(Central Office)1082
Semiconductor devices; measuring method for small-signal cut-off frequency of a photodiode; identical with IEC 47(Central Office)1081
Semiconductor devices; essential ratings and characteristics of laser module with pigtail, amendment; identical with IEC 47(Central Office)1185
Semiconductor devices; supplement to the sectional specification for optoelectronic devices; identical with IEC 47(Central Office)1153
Optoelectronic semiconductor devices; light-emitting diodes, infrared-emitting diodes and laser diodes; measuring method for small-signal cut-off frequency; identical with IEC 47(Central Office)1083
Semiconductor devices; additional measuring method for LED, IRED and laser diodes; identical with IEC 47(Central Office)1088
Semiconductor devices; sectional specification for optoelectronic devices; identical with IEC 47(Central Office)1090
Optoelectronic semiconductor devices; measuring methods for photodiodes and phototransistors for fibre optic applications; identical with IEC 47(Central Office)1080
Semiconductor devices; measuring method for threshold current of laser diodes; identical with IEC 47(Central Office)1087
