37.020 : Optical equipment

ASTM E2228-22

ASTM E2228-22

Superseded Historical

Standard Guide for Microscopical Examination of Textile Fibers

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ASTM E766-98(2008)e1

ASTM E766-98(2008)e1

Superseded Historical

Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope

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ASTM E2642-08

ASTM E2642-08

Superseded Historical

Standard Terminology for Scientific Charge-Coupled Device (CCD) Detectors

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ASTM E2642-09

ASTM E2642-09

Superseded Historical

Standard Terminology for Scientific Charge-Coupled Device (CCD) Detectors

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ASTM E1791-96(2008)e1

ASTM E1791-96(2008)e1

Superseded Historical

Standard Practice for Transfer Standards for Reflectance Factor for Near-Infrared Instruments Using Hemispherical Geometry

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ASTM E2228-10

ASTM E2228-10

Superseded Historical

Standard Guide for Microscopic Examination of Textile Fibers

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ASTM E986-04(2010)

ASTM E986-04(2010)

Superseded Historical

Standard Practice for Scanning Electron Microscope Beam Size Characterization

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ASTM F1863-10

ASTM F1863-10

Superseded Historical

Standard Test Method for Measuring the Night Vision Goggle-Weighted Transmisivity of Transparent Parts

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ASTM E210-63(2010)

ASTM E210-63(2010)

Superseded Historical

Standard Specification for Microscope Objective Thread

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ASTM E211-82(2010)

ASTM E211-82(2010)

Superseded Historical

Standard Specification for Cover Glasses and Glass Slides for Use in Microscopy

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ASTM E2228-02

ASTM E2228-02

Superseded Historical

Standard Guide for Microscopic Examination of Textile Fibers

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ASTM E1951-02(2007)

ASTM E1951-02(2007)

Superseded Historical

Standard Guide for Calibrating Reticles and Light Microscope Magnifications

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ASTM C1661-07

ASTM C1661-07

Superseded Historical

Standard Guide for Viewing Systems for Remotely Operated Facilities

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ASTM E766-14

ASTM E766-14

Superseded Historical

Standard Practice for Calibrating the Magnification of a Scanning Electron Microscope

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ASTM E1791-96(2014)

ASTM E1791-96(2014)

Superseded Historical

Standard Practice for Transfer Standards for Reflectance Factor for Near-Infrared Instruments Using Hemispherical Geometry

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