37.040.20 : Photographic paper, films and plates. Cartridges

ASTM E2244-05

ASTM E2244-05

Superseded Historical

Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer

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ASTM E2246-05

ASTM E2246-05

Superseded Historical

Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer

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ASTM E2245-05

ASTM E2245-05

Superseded Historical

Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer

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ASTM F2296-04

ASTM F2296-04

Superseded Historical

Standard Practice for Determining the Adhesion of Lamination Films to Prints Utilizing Mechanical Stress: Four Different Test Methods-Score/Tape, Cross Hatch, X-Cut, and Crease-Folding

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ASTM F2296-03

ASTM F2296-03

Superseded Historical

Standard Practice for Determining the Adhesion of Lamination Films to Prints Utilizing Mechanical Stress: Four Different Test Methods-Score/Tape, Cross Hatch, X-Cut, and Crease-Folding

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ASTM E2245-02

ASTM E2245-02

Superseded Historical

Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer

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ASTM E1735-95(2000)e1

ASTM E1735-95(2000)e1

Superseded Historical

Standard Test Method for Determining Relative Image Quality of Industrial Radiographic Film Exposed to X-Radiation from 4 to 25 MV

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ASTM F1225-99

ASTM F1225-99

Superseded Historical

Standard Test Method for Measuring the Ribbon Exit Force for Film and Fabric Cartridges

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ASTM E2245-11

ASTM E2245-11

Superseded Historical

Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer

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ASTM E2244-11

ASTM E2244-11

Superseded Historical

Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer

This product is not for sale, please contact us for more information

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ASTM E2244-02

ASTM E2244-02

Superseded Historical

Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer

This product is not for sale, please contact us for more information

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ASTM E2246-02

ASTM E2246-02

Superseded Historical

Standard Test Method for Strain Gradient Measurements of Thin, Reflecting Films Using an Optical Interferometer

This product is not for sale, please contact us for more information

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ASTM E1735-07

ASTM E1735-07

Superseded Historical

Standard Test Method for Determining Relative Image Quality of Industrial Radiographic Film Exposed to X-Radiation from 4 to 25 MeV

This product is not for sale, please contact us for more information

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ASTM E2244-11e1

ASTM E2244-11e1

Superseded Historical

Standard Test Method for In-Plane Length Measurements of Thin, Reflecting Films Using an Optical Interferometer

This product is not for sale, please contact us for more information

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ASTM E2245-11e1

ASTM E2245-11e1

Superseded Historical

Standard Test Method for Residual Strain Measurements of Thin, Reflecting Films Using an Optical Interferometer

This product is not for sale, please contact us for more information

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