Committee F01 on Electronics

ASTM F773M-96

ASTM F773M-96

Superseded Historical

Practice for Measuring Dose Rate Response of Linear Integrated Circuits

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ASTM F616M-96

ASTM F616M-96

Superseded Historical

Standard Test Method for Measuring MOSFET Drain Leakage Current (Metric)

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ASTM F1771-97

ASTM F1771-97

Superseded Historical

Standard Test Method for Evaluating Gate Oxide Integrity by Voltage Ramp Technique

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ASTM F1809-97

ASTM F1809-97

Superseded Historical

Standard Guide for Selection and Use of Etching Solutions to Delineate Structural Defects in Silicon

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ASTM F1995-00

ASTM F1995-00

Superseded Historical

Standard Test Method for Determining the Bond Strength for a Surface Mount Device (SMD) by Applying Shear Force on a Membrane Switch

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ASTM F1996-01

ASTM F1996-01

Superseded Historical

Standard Test Method for Silver Migration for Membrane Switch Circuitry

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ASTM F1997-99

ASTM F1997-99

Superseded Historical

Standard Test Method for Determining the Sensitivity (Teasing) of a Tactile Membrane Switch

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ASTM F2072-01

ASTM F2072-01

Superseded Historical

Standard Practice for Hosedown of a Membrane Switch

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ASTM F2073-01

ASTM F2073-01

Superseded Historical

Standard Test Method for Non-Destructive Short Circuit Testing of a Membrane Switch

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ASTM F2113-01e1

ASTM F2113-01e1

Superseded Historical

Standard Guide for Analysis and Reporting the Impurity Content and Grade of High Purity Metallic Sputtering Targets for Electronic Thin Film Applications

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ASTM F2112-02

ASTM F2112-02

Superseded Historical

Standard Terminology for Membrane Switches

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ASTM F2187-02

ASTM F2187-02

Superseded Historical

Standard Test Method for Determining the Effect of Random Frequency Vibration on a Membrane Switch or Membrane Switch Assembly

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ASTM F2188-02

ASTM F2188-02

Superseded Historical

Standard Test Method for Determining the Effect of Variable Frequency Vibration on a Membrane Switch or Membrane Switch Assembly

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ASTM F2113-01

ASTM F2113-01

Superseded Historical

Standard Guide for Analysis and Reporting the Impurity Content and Grade of High Purity Metallic Sputtering Targets for Electronic Thin Film Applications

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ASTM F1269-89(1995)e1 (R2001)

ASTM F1269-89(1995)e1 (R2001)

Superseded Historical

Test Methods for Destructive Shear Testing of Ball Bonds

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