Standard Test Methods for Measuring Pull Strength of Microelectronic Wire Bonds
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Standard Specification for Gold Wire for Semiconductor Lead Bonding
Standard Practice for Determining Barium Yield, Getter Gas Content, and Getter Sorption Capacity for Barium Flash Getters
Standard Practice for Definition and Determination of Thermionic Constants of Electron Emitters
Standard Test Method for Surface Flaws in Tungsten Seal Rod and Wire
Standard Specification for Semiconductor Device Passivation Opening Layouts
Standard Guide for Neutron Irradiation of Unbiased Electronic Components
Standard Specification for Brazing Filler Metals for Electron Devices
Standard Specification for Molybdenum Flattened Wire for Electron Tubes
Standard Specification for Format, Physical Properties, and Test Methods for 19 and 35 mm Testable Tape Carrier for Perimeter Tape Carrier-Bonded Semiconductor Devices
Standard Specification for Fine Aluminum-1% Magnesium Wire for Semiconductor Lead-Bonding
Standard Specification for Tungsten Wire for Electron Devices and Lamps
Standard Specification for Nickel Strip for Electron Tubes
Standard Specification for Iron-Nickel Sealing Alloys
Standard Specification for Molybdenum Wire and Rod for Electronic Applications
