IEC 62529:2012(E) Standard for Signal and Test Definition
€354.00
IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description
€53.00
IEEE Standard for Automatic Test Markup Language (ATML) Test Station Description
€78.00
IEC 62243:2012(E) (IEEE Std 1232-2010): Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE)
€331.00
IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505
€156.00