Test and Diagnosis for Electronic Systems

IEEE/IEC 62529:2012

IEEE/IEC 62529:2012

Superseded Historical

IEC 62529:2012(E) Standard for Signal and Test Definition

€354.00

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IEEE 1671.5:2015

IEEE 1671.5:2015

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IEEE Standard for Automatic Test Markup Language (ATML) Test Adapter Description

€53.00

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IEEE 1671.6:2015

IEEE 1671.6:2015

Active Most Recent

IEEE Standard for Automatic Test Markup Language (ATML) Test Station Description

€78.00

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IEEE/IEC 62243:2010

IEEE/IEC 62243:2010

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IEC 62243:2012(E) (IEEE Std 1232-2010): Artificial Intelligence Exchange and Service Tie to All Test Environments (AI-ESTATE)

€331.00

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IEEE 1505.1:2019

IEEE 1505.1:2019

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IEEE Standard for the Common Test Interface Pin Map Configuration for High-Density, Single-Tier Electronics Test Requirements Utilizing IEEE Std 1505

€156.00

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