Test and Diagnosis for Electronic Systems

IEEE 1671.5:2008

IEEE 1671.5:2008

Superseded Historical

IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML:Exchanging Test Adapter Information

€68.00

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IEEE 1671.6:2008

IEEE 1671.6:2008

Superseded Historical

IEEE Standard for Automatic Test Markup Language (ATML) for Exchanging Automatic Test Information via XML: Exchanging Test Station Information

€68.00

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IEEE/IEC 62243:2002

IEEE/IEC 62243:2002

Superseded Historical

IEC/IEEE International Standard - Artificial intelligence exchange and service tie to all test environments (AI-ESTATE)

€320.00

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IEEE/IEC 62529:2007

IEEE/IEC 62529:2007

Superseded Historical

IEC 62529 Ed. 1 Standard for Signal and Test Definition

€408.00

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IEEE 1505:2010

IEEE 1505:2010

Withdrawn Most Recent

IEEE Standard for Receiver Fixture Interface

€148.00

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IEEE/IEC 63003:2015

IEEE/IEC 63003:2015

Active Most Recent

IEC/IEEE International standard for the common test interface pin map configuration for high-density, single-tier electronics test requirements utilizing IEEE Std 1505(TM)

€319.00

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IEEE/IEC 63004:2015

IEEE/IEC 63004:2015

Active Most Recent

IEC/IEEE International standard for receiver fixture interface

€308.00

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IEEE 1636:2018

IEEE 1636:2018

Active Most Recent

IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA)

€65.00

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IEEE/IEC 61671-2:2016

IEEE/IEC 61671-2:2016

Active Most Recent

IEC/IEEE International Standard for Automatic Test Markup Language (ATML) Instrument Description

€79.00

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IEEE/IEC 61671-4:2016

IEEE/IEC 61671-4:2016

Active Most Recent

IEC/IEEE International Standard - Standard for Automatic Test Markup Language (ATML) Test Configuration

€79.00

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IEEE/IEC 61671-5:2016

IEEE/IEC 61671-5:2016

Active Most Recent

IEC/IEEE International Standard - Automatic Test Markup Language (ATML) Test Adapter Description

€64.00

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IEEE/IEC 61671-6:2016

IEEE/IEC 61671-6:2016

Active Most Recent

IEC/IEEE International Standard - Standard for Automatic Test Markup Language (ATML) Test Station Description

€64.00

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IEEE 1636.1:2018

IEEE 1636.1:2018

Active Most Recent

IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Test Results and Session Information via the eXtensible Markup Language (XML)

€65.00

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IEEE 1641:2022

IEEE 1641:2022

Active Most Recent

IEEE Standard for Signal and Test Definition

€200.00

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IEEE 1636.1-2018/Cor 1:2023

IEEE 1636.1-2018/Cor 1:2023

Active Most Recent

IEEE Standard for Software Interface for Maintenance Information Collection and Analysis (SIMICA): Exchanging Test Results and Session Information via the eXtensible Markup Language (XML) - Corrigenda 1

€0.00

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