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IEEE/IEC 61671-5:2016
IEC/IEEE International Standard - Automatic Test Markup Language (ATML) Test Adapter Description
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An exchange format using extensible markup language (XML) for identifying all of the hardware, software, and documentation associated with a test adapter is specified in this document. This test adapter may be used as a component of a test program set to test and diagnose a unit under test.
This standard defines an exchange format, utilizing XML, for both the static description of a test adapter by
defining the interface between the UUT and the test station, and the specific description of test adapter instance information.
An exchange format using extensible markup language (XML) for identifying all of the hardware, software, and documentation associated with a test adapter is specified in this document. This test adapter may be used as a component of a test program set to test and diagnose a unit under test.
This standard defines an exchange format, utilizing XML, for both the static description of a test adapter by
defining the interface between the UUT and the test station, and the specific description of test adapter instance information.
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Technical characteristics
| Publisher | Institute of Electrical and Electronics Engineers (IEEE) |
| Publication Date | 04/08/2016 |
| Edition | |
| Page Count | 32 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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