Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
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Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices
Standard Guide for Use of an X-Ray Tester ([approximate]10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices
Standard Guide for Neutron Irradiation of Unbiased Electronic Components
Standard Test Method for Fluid and Grease Resistance of Thermoset Encapsulating Compounds Used in Electronic and Microelectronic Applications
Standard Test Method for Combined Fine and Gross Leaks for Large Hybrid Microcircuit Packages
