Superseded
Standard
Historical
ASTM F1263-99
Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
Summary
1.1 This guide covers the use of overtesting in order to reduce the required number of parts that must be tested to meet a given quality acceptance standard. Overtesting is testing a sample number of parts at a stress higher than their specification stress in order to reduce the amount of necessary data taking. This guide discusses when and how overtesting may be applied to forming probabilistic estimates for the survival of electronic piece parts subjected to radiation stress. Some knowledge of the probability distribution governing the stress-to-failure of the parts is necessary though exact knowledge may be replaced by over-conservative estimates of this distribution.
Technical characteristics
| Publisher | American Society for Testing and Materials (ASTM International) |
| Publication Date | 12/10/1999 |
| Collection | |
| Page Count | 3 |
| Themes | Electronic components in general |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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Previous versions
01/02/2025
Active
Most Recent
01/06/2011
Superseded
Historical
01/06/2011
Superseded
, Reaffirmed
Historical
10/12/1999
Superseded
Historical
10/12/1999
Superseded
, Reaffirmed
Historical