31.020 : Electronic components in general

VG 95214-5:2019-12

VG 95214-5:2019-12

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Test methods of components - Part 5: Testing of junctions with heat shrinkable components; Text in German and English

€105.42

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VG 95214-16:2000-09

VG 95214-16:2000-09

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Test methods of components - Part 16: Abrasion

€56.17

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VG 95214-11:2002-11

VG 95214-11:2002-11

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Test of components - Part 11: Measuring methods for transfer impedance and screening attenuation, transfer impedance of screened components (line-injection method, KS 11 B).

€69.91

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VG 95214-12:2002-11

VG 95214-12:2002-11

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Test of components - Part 12: Measuring methods for transfer impedance and screening attenuation, transfer impedance of screened components (triaxial method, KS 12 B) and conductive gaskets (triaxial method, KS 22 B).

€77.20

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IEEE 1573:2021

IEEE 1573:2021

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IEEE Recommended Practice for Electronic Power Subsystems: Parameters, Interfaces, Elements, and Performance

€125.00

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ASTM E1854-26

ASTM E1854-26

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Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts

€72.00

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ASTM F1263-25

ASTM F1263-25

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Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts

€58.00

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ASTM F97-72(2002)e1

ASTM F97-72(2002)e1

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Standard Practices for Determining Hermeticity of Electron Devices by Dye Penetration (Withdrawn 2008)

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ASTM F677-13

ASTM F677-13

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Standard Test Method for Fluid and Grease Resistance of Thermoset Encapsulating Compounds Used in Electronic and Microelectronic Applications (Withdrawn 2013)

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ASTM F239-81(1987)

ASTM F239-81(1987)

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Specification for Nickel Alloy Cathode Sleeves for Electron Devices (Withdrawn 1992)

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ASTM F135-76(1991)

ASTM F135-76(1991)

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Test Method for Embedment Stress Caused by Casting Compounds on Glass-Encased Electronic Components (Withdrawn 1997)

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ISO 17901-1:2015 (R2025)

ISO 17901-1:2015 (R2025)

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Optics and photonics — Holography Part 1: Methods of measuring diffraction efficiency and associated optical characteristics of holograms

€115.00

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ISO 17901-2:2015 (R2025)

ISO 17901-2:2015 (R2025)

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Optics and photonics — Holography Part 2: Methods for measurement of hologram recording characteristics

€155.00

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BS EN IEC 61760-2:2021

BS EN IEC 61760-2:2021

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Surface mounting technology Transportation and storage conditions of surface devices (SMD). Application guide

€193.00

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BS EN IEC 63002:2021

BS EN IEC 63002:2021

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Interoperability specifications and communication method for external power supplies used with computing and consumer electronics devices

€316.00

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