Measurement of piezoelectric crystal unit parameters - Part 9: Measurement of spurious resonances of piezoelectric crystal units (IEC 49/693/CD:2004)
€84.58
Waveguide type dielectric resonators - Part 1-4: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at millimeter-wave frequency (IEC 49/697/CD:2004)
€111.40
Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification (IEC 49/710/CD:2005)
€190.65
Synthetic quartz crystal - Specifications and guide to the use (IEC 60758:2004); German version EN 60758:2005.
€128.22
Measurements and test methods for 200 kHz or less quartz crystal units and standard values (IEC 49/747/CD:2005)
€77.20
Single crystal wafers for surface acoustic wave (SAW) device applications - Specifications and measuring methods (IEC 62276:2005); German version EN 62276:2005.
€116.64
Piezoelectric, dielectric and electrostatic devices for frequency control, selection and detection - Glossary - Part 2 : Piezoelectric and dielectric filters (IEC 49/896/CD:2010)
€105.42
Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection - Glossary - Part 3 : Piezoelectric and dielectric oscillators (IEC 49/900/CD:2010)
€91.03
Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections (IEC 49/906/CD:2010)
Measurement of Quartz Crystal Unit Parameters - Part 11: Standard Method for the determination of the load resonance frequency f and the effective load capacitance C using automatic network analyzer techniques and error correction (IEC 49/806/CD:2008)
Measurement of quartz crystal unit parameters - Part 6: Measurement of drive level dependence (DLD) (IEC 49/812/CD:2008)
€122.34
Quartz crystal controlled oscillators of assessed quality - Part 6: Phase jitter measurement method for quartz crystal oscillators and SAW oscillators - Application guide (IEC 49/811/CDV:2008); German version FprEN 60679-6:2008
Surface Acoustic Wave (SAW) and Bulk Acoustic Wave (BAW) duplexers - Part 2 : Guide to the use (IEC 49/832/CD:2008)
Piezoelectric filters of assessed quality - Part 3: Standard outlines and lead connections (IEC 49/838/CD:2009)
€98.32
Quartz crystal controlled oscillators of assessed quality - Part 3: Standard outlines and lead connections (IEC 49/839/CD:2009)
