Amendment 1 to IEC 60444-5: Standards of the measurement of surface mounted quartz crystal units (IEC 49/337/CD:1996)
€41.78
IEC 60679-5: Quartz crystal controlled oscillators - A specification in the IEC Quality assessment system for electronic components (IECQ) - Part 5: Sectional specification; qualification approval (IEC 49/346/CDV:1996)
€69.91
IEC 60679-5-1: Quartz crystal controlled oscillators - A specification in the IEC Quality assessment system for electronic components (IECQ) - Part 5: Sectional specification; qualification approval; section 1: Blank detail specification (IEC 49/347/CDV:1996)
€63.27
Amendment to IEC 49/333/CDV: Quartz crystal controlled oscillators - A specification in the IEC Quality Assessment System for Electronic Components (IECQ) - Part 1: Generic specification (IEC 49/342/CDV:1996)
€56.17
A standardized test procedure for the characterization of latch up in crystal controlled oscillators CMOS integrated circuits (IEC 49/363/CD:1996)
Glossary for piezoelectric and dielectric devices for frequency control and selection - Part 2: Piezoelectric and dielectric filters (IEC 49/365/CD:1997)
International electrotechnical vocabulary; part 561: piezoelectric devices for frequency control and selection; identical with IEC 60050-561:1991
Quartz crystal units for frequency control and selection; part 2: guide to use of quartz crystal units for frequency control and selection; section one: quartz crystal units for microprocessor clock supply; amendment 1 to IEC 60122-2-1; identical with IEC 49(Central Office)245
Measurement of quartz crystal unit parameters by zero phase technique in a -network; part 2: phase offset method for measurement of motional capacitance of quartz crystal units; identical with IEC 60444-2:1980
€48.79
Measurement of quartz crystal unit parameters by zero phase technique in a -network; part 4: method for the measurement of load resonance frequency f, load resonance resistance R and the calculation of other derived values of quartz crystal units, up to 30 MHz; identical with IEC 60444-4:1988
Quartz crystal units for frequency control and -selection; part 1: standard values and test conditions; identical with IEC 60122-1:1976
Methods for the measurement of quartz crystal devices for the determination of equivalent electrical parameters using automatic network analyser techniques and error correction; identical with IEC 49(Central Office)248
€111.40
Measurement of quartz crystal unit parameters by zero phase technique in a -network; part 1: basic method for the measurement of resonance frequency and resonance resistance of quartz crystal units by zero phase technique in a -network; identical with IEC 60444-1:1986
€84.58
Measurement of quartz crystal unit parameters by zero phase technique in a -network; part 3: basic method for the measurement of two-terminal parameters of quartz crystal units up to 200 MHz by phase technique in a -network with compensation of the parallel capacitance C; identical with IEC 60444-3:1986
Measurement of Drive Level Dependence (DLD) of crystal units; identical with IEC 49(Secretariat)193
