Superseded Draft standard
Historical

DIN IEC 49/363/CD:1997-02

A standardized test procedure for the characterization of latch up in crystal controlled oscillators CMOS integrated circuits (IEC 49/363/CD:1996)

Summary

Genormtes Prüfverfahren für die Bestimmung des "Latch-Up"-Effektes in CMOS-IC-Quarz-Oszillatoren (IEC 49/363/CD:1996)

Technical characteristics

Publisher Deutsche Institut für Normung e.V. (DIN)
Publication Date 02/01/1997
Page Count 8
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