Quartz crystal units of assessed quality - Part 3 : standard outlines and lead connections
€87.39
Measurement of quartz crystal unit parameters - Part 6 : measurement of drive level dependence (DLD)
€111.67
Waveguide type dielectric resonators - Part 2: Guidelines for oscillator and filter applications (IEC 61338-2:2004); German version EN 61338-2:2004
€111.40
Filters using waveguide type dielectric resonators - Part 2: Guidance for use (IEC 61337-2:2004); German version EN 61337-2:2004
€105.42
Piezoelectric filters of assessed quality - Part 1: Generic specification (IEC 60368-1:2000 + A1:2004); German version EN 60368-1:2000 + A1:2004.
€116.64
Surface acoustic wave (SAW) resonators - Part 1: Generic specification (IEC 61019-1:2004); German version EN 61019-1:2005
Filters using waveguide type dielectric resonators - Part 1:Generic specification (IEC 61337-1:2004); German version EN 61337-1:2004.
Measurement of quartz crystal unit parameters - Part 7: Measurement of activity and frequency dips of quartz crystal units (IEC 60444-7:2004); German version EN 60444-7:2004
€56.17
Waveguide type dielectric resonators - Part 4: Sectional specification (IEC 61338-4:2005); German version EN 61338-4:2005
€98.32
Surface acoustic wave (SAW) resonators - Part 2: Guide to the use (IEC 61019-2:2005); German version EN 61019-2:2005.
Waveguide tyoe dielectric resonators - Part 4-1: Blank detail specification (IEC 61338-4-1:2005); German version EN 61338-4-1:2005
Quartz crystal controlled oscillators - Part 2: Guide to the use of quartz crystal controlled oscillators (IEC 60679-2:1981)
€84.58
Piezoelectric devices - Preparation of outline drawings of surface mounted devices (SMD) for frequency control and selection; General rules (IEC 61240:1994); German version EN 61240:1997.
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 2: Phase offset method for measurement of motional capacitance of quartz crystal units (IEC 60444-2:1980); German version EN 60444-2:1997
Measurement of quartz crystal unit parameters by zero phase technique in a pi-network - Part 3: Basic method for the measurement of two-terminal parameters of quartz crystal units up to 200 MHz by phase technique in a pi-network with compensation of the parallel capacitance C (IEC 60444-3:1986); German version EN 60444-3:1997
€63.27
