Quartz crystal controlled oscillators of assessed quality - Part 1: Generic specification (IEC 49/1013/CD:2012)
€48.79
Synthetic quart crystal - Specifications and guidelines for the use (IEC 49/1041/CD:2013)
€162.06
Waveguide type dielectric resonators - Part 1-4: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at millimetre-wave frequency (IEC 61338-1-4:2005); German version EN 61338-1-4:2006
€111.40
Piezoelectric and dielectric devices for frequency control and selection - Glossary - Part 1: Piezoelectric and dielectric resonators (IEC 49/755/CD:2006)
€98.32
Waveguide type dielectric resonators - Part 1-4: General information and test conditions - Measurement method of complex relative permittivity for dielectric resonator materials at millimetre-wave frequency (IEC 61338-1-4:2005); German version EN 61338-1-4:2006, Corrigenda to DIN EN 61338-1-4:2006-06; CENELEC-Corrigendum November 2006 to EN 61338-1-4:2006
€0.00
Duplexeurs à ondes acoustiques de surface (OAS) et à ondes acoustiques de volume (OAV) sous assurance de la qualité - Partie 1 : Spécification générique
€126.00
Duplexeurs à ondes acoustiques de surface (OAS) et à ondes acoustiques de volume (OAV) sous assurance de la qualité - Partie 2 : Lignes directrices d'utilisation
€111.67
Capteurs piézoélectriques - Partie 1 : spécifications génériques
Tranches monocristallines pour applications utilisant des dispositifs à ondes acoustiques de surface (OAS) - Spécifications et méthodes de mesureAutomatic translation from French : Single Crystal Wafers for Applications Using Surface Acoustic Wave (OAS) Devices – Specifications and Measurement Methods
€117.00
Piezoelectric devices - Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection - General rules (IEC 49/1141/CD:2015)
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement (IEC 49/1150/CD:2015)
€173.74
Waveguide type dielectric resonators - Part 1-5: General information and test conditions - Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency (IEC 61338-1-5:2015); German version EN 61338-1-5:2015
€105.42
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality - Part 1: Generic specification (IEC 62604-1:2015); German version EN 62604-1:2015.
€122.34
Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units (IEC 60444-8:2016); German version EN 60444-8:2017.
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators - Part 1: Basic methods for the measurement (IEC 62884-1:2017); German version EN 62884-1:2017
