31.200 : Integrated circuits. Microelectronics

NF C96-111/A1 (10/1980)

NF C96-111/A1 (10/1980)

Withdrawn Most Recent

Microstructures - Microstructures analogiques - Amplificateurs opérationnels de tension - Prescriptions générales

€29.00

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UTE C86-212/A1, C86-212/A1U (09/1986)

UTE C86-212/A1, C86-212/A1U (09/1986)

Withdrawn Most Recent

Additif 1 à la publication UTE C 86-212 de novembre 1983

€300.00

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UTE C86-212/A2, C86-212/A2U (10/1986)

UTE C86-212/A2, C86-212/A2U (10/1986)

Withdrawn Most Recent

Additif 2 à la publication UTE C 86-212 de novembre 1983

€240.67

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UTE C86-212/A3, C86-212/A3U (11/1986)

UTE C86-212/A3, C86-212/A3U (11/1986)

Withdrawn Most Recent

Additif 3 à la publication UTE C 86-212 de novembre 1983

€106.33

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DIN 51456:2013-10

DIN 51456:2013-10

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Testing of materials for semiconductor technology - Surface analysis of silicon wafers by multielement determination in aqueous analysis solutions using mass spectrometry with inductively coupled plasma (ICP-MS)

€69.91

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DIN EN 62435-1:2013-10

DIN EN 62435-1:2013-10

Superseded Historical

Electronic components - Long-term storage of electronic semiconductor devices - Part 1: General (IEC 47/2172/CD:2013)

€116.64

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DIN EN 62435-2:2013-10

DIN EN 62435-2:2013-10

Superseded Historical

Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration Mechanisms (IEC 47/2173/CD:2013)

€84.58

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DIN EN 62435-5:2013-10

DIN EN 62435-5:2013-10

Superseded Historical

Electronic components - Long-term storage of electronic semiconductor devices - Part 5: Die & Wafer Devices (IEC 47/2174/CD:2013)

€84.58

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DIN EN 62433-2:2010-05

DIN EN 62433-2:2010-05

Superseded Historical

EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE) (IEC 62433-2:2008); German version EN 62433-2:2010.

€140.00

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DIN IEC 62215-3:2010-05

DIN IEC 62215-3:2010-05

Superseded Historical

Integrated circuits - Measurement of impulse immunity - Part 3: Non-synchronous transient injection method (IEC 47A/839/CD:2010)

€122.34

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DIN EN 60747-16-3:2009-11

DIN EN 60747-16-3:2009-11

Superseded Historical

Semiconductor devices - Part 16-3: Microwave integrated circuits - Frequency converters (IEC 60747-16-3:2002 + A1:2009); German version EN 60747-16-3:2002 + A1:2009.

€145.14

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DIN EN 62417:2010-12

DIN EN 62417:2010-12

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Semiconductor devices - Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs) (IEC 62417:2010); German version EN 62417:2010

€63.27

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UTE C96-030, C96-030U (07/1988)

UTE C96-030, C96-030U (07/1988)

Withdrawn Most Recent

Microstructures - Structure d'agrément des programmes de test associés aux spécifications particulières de circuits intégrés VLSI et procédure afférente

€56.33

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UTE C96-112, C96-112U (10/1980)

UTE C96-112, C96-112U (10/1980)

Withdrawn Most Recent

Microstructures - Microstructures analogiques - Régulateurs de tension à circuit intégré - Recueil de spécifications particulières.

€86.50

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UTE C86-254, C86-254U (08/1988)

UTE C86-254, C86-254U (08/1988)

Withdrawn Most Recent

Composants électroniques - Mémoires RAM statiques lecture/écriture à circuits intégrés - Recueil de spécifications particulières

€74.00

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