IEEE Guide for Design of Substation Rigid-Bus Structures
€53.00
IEEE Guide for the Design of Substation Rigid-Bus Structures
€178.00
IEEE Standard for Microprocessor Universal Format for Object Modules
€90.00
IEEE Standard Test Access Port and Boundary Scan Architecture
€157.00
IEEE Recommended Practice for Latchup Test Methods for CMOS and BiCMOS Integrated- Circuit Process Characterization
€186.00
IEEE Standard for Terminology and Test Methods for Analog-to-Digital Converters
€149.00
IEEE Standard Testability Method for Embedded Core-based Integrated Circuits
€154.00
Practice for Measuring Dose Rate Response of Linear Integrated Circuits
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Method for Identification of Metal Particulate Contamination Found in Electronic and Microelectronic Components and Systems Using the Ring Oven Technique, With Spot Tests (Withdrawn 1994)
Definitions of Terms Relating to Relating to Photomasking Technology for Microelectronics (Withdrawn 1992)
Guide for Analysis of Latchup Susceptibility in Bipolar Integrated Circuits (Withdrawn 1987)
Specification for harmonized system of quality assessment for electronic components. Family specification: C. MOS digital integrated circuits series 4000 B and 4000 UB
€269.00
IEEE Guide for Bus Design in Air Insulated Substations
€92.00
IEEE Standard for an Advanced Library Format (ALF) Describing Integrated Circuit (IC) Technology, Cells, and Blocks
€367.00
IEEE Standard for Integrated Circuit (IC) Open Library Architecture (OLA)
€311.00
