31.200 : Integrated circuits. Microelectronics

DIN EN 62258-2:2005-12

DIN EN 62258-2:2005-12

Superseded Historical

Semiconductor die products - Part 2: Exchange data formats (IEC 62258-2:2005); German version EN 62258-2:2005, text in English.

€157.10

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DIN IEC 62433:2005-12

DIN IEC 62433:2005-12

Superseded Historical

Models of Integrated Circuits for EMI behavioural simulation (IEC 47A/726/CD:2005)

€150.65

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DIN IEC 62215-2:2005-12

DIN IEC 62215-2:2005-12

Withdrawn Most Recent

Integrated circuits - Measurement of impulse immunity - Part 2: Fast Impulse Injection method (IEC 47A/730/CD:2005)

€105.42

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DIN EN 62258-1:2006-04

DIN EN 62258-1:2006-04

Superseded Historical

Semiconductor die products - Part 1: Requirements for procurement and use (IEC 62258-1:2005); German version EN 62258-1:2005.

€122.34

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DIN 51456:2012-10

DIN 51456:2012-10

Superseded Historical

Testing of materials for semiconductor technology - Surface analysis of silicon wafers by multielement determination in aqueous analysis solutions using mass spectrometry with inductively coupled plasma (ICP-MS)

€63.27

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DIN IEC 62258-3:2008-05

DIN IEC 62258-3:2008-05

Withdrawn Most Recent

Semiconductor die products - Part 3: Recommendations for good practice in handling, packing and storage (IEC 47/1950/CD:2008)

€173.74

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DIN IEC 62132-8:2009-05

DIN IEC 62132-8:2009-05

Superseded Historical

Integrated circuits - Measurement of electromagnetic immunity - Part 8: Measurement of radiated immunity - IC Stripline method (IEC 47A/811/CD:2009)

€105.42

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DIN IEC 61967-8:2009-05

DIN IEC 61967-8:2009-05

Superseded Historical

Integrated circuits - Measurement of electromagnetic emissions - Part 8: Measurement of radiated emissions - IC Stripline method (IEC 47A/810/CD:2009)

€105.42

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DIN EN 62258-2:2009-10

DIN EN 62258-2:2009-10

Superseded Historical

Semiconductor die products - Part 2: Exchange data formats (IEC 47/2023/CDV:2009); English version FprEN 62258-2:2009

€185.05

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DIN IEC 47A/541/CDV:1999-04

DIN IEC 47A/541/CDV:1999-04

Withdrawn Most Recent

IEC 61748: Manufacturing line approval for MCM (QML) (IEC 47A/541/CDV:1999, text in English)

€48.79

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DIN EN 61967-1:2000-03

DIN EN 61967-1:2000-03

Superseded Historical

Integrated circuits - Measurement of electromagnetic emissions 150 kHz to 1 GHz - Part 1: General and definitions (IEC 47A/569/CD:1999)

€84.58

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DIN EN 61967-4:2000-03

DIN EN 61967-4:2000-03

Superseded Historical

Integrated circuits - Measurement of electromagnetic emissions 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions 1 ohm/150 ohm; direct coupling method (IEC 47A/566/CD:1999)

€105.42

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DIN EN 61967-5:2000-03

DIN EN 61967-5:2000-03

Superseded Historical

Integrated circuits - Measurement of electromagnetic emissions 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions, workbench Faraday cage method (IEC 47A/567A/CD:1999)

€84.58

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DIN EN 61967-6:2000-03

DIN EN 61967-6:2000-03

Superseded Historical

Integrated circuits - Measurement of electromagnetic emissions 150 kHz to 1 GHz - Part 6: Measurement of RF currents, magnetic probe method (IEC 47A/568/CD:1999)

€91.03

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DIN IEC 47A/596/CD:2001-01

DIN IEC 47A/596/CD:2001-01

Withdrawn Most Recent

IEC 62113: Integrated circuits - Product discontinuance notification by suppliers and distributors (IEC 47A/596/CD:2000)

€56.17

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