Analogue circuits; amendments to the measuring methods for common-mode rejection ratio of integrated linear amplifiers (including operational amplifiers)
€34.30
Semiconductor devices and integrated circuits; general principles of measuring methods revision of publication 147-2 (continued): voltage-reference and voltage-regulator diodes, varbiable-capacitance diodes
General principles of measuring methods; new measuring methods intended to be introduced in IEC publication 60147-2
€48.79
Harmonized system of quality assessment for electronic components; blank detail specification; fusible link programmable read only memories, silicon monolithic integrated circuits
€77.20
Reliability details to be given in data sheets; mode of representation
€24.39
Semiconductor devices and integrated circuits; kinds of devices and general terms
€84.58
Integrated film circuits; material, methods for judgement of thick film resistor compositions
Electrical measuring methods for integrated circuits; recovery time t
Electrical measuring methods for integrated circuits; output pulse duration t
Rules for the preparation of detail specifications for integrated circuits of assessed quality: TTL digital gate circuits. General application category
€165.00
Rules for the preparation of detail specifications for integrated circuits of assessed quality: DTL digital gate circuits (general application category)
€193.00
Rules for the preparation of detail specifications for integrated circuits of assessed quality: TTL digital inverter circuits. General application category
Rules for the preparation of detail specifications for integrated circuits of assessed quality: DTL digital inverter circuits. General application category
Rules for the preparation of detail specifications for integrated circuits of assessed quality: TTL digital interconnected gate circuits. General application category
Rules for the preparation of detail specifications for integrated circuits of assessed quality: TTL digital bistable circuits. General application category
