Rules for the preparation of detail specifications for integrated circuits of assessed quality: complex digital circuits - bipolar. General application category
€193.00
Rules for the preparation of detail specifications for integrated circuits of assessed quality: TTL binary counter circuits. General application category
Rules for the preparation of detail specifications for integrated circuits of assessed quality: TTL binary memory circuits. General application category
Rules for the preparation of detail specifications for integrated circuits of assessed quality: insulated gate shift registers. General application category
€165.00
Rules for the preparation of detail specifications for integrated circuits of assessed quality: differential comparator amplifiers. General application category
Rules for the preparation of detail specifications for integrated circuits of assessed quality: microwave amplifiers. Full assessment level
Harmonized system of quality assessment for electronic components; family specification: digital integrated TTL-Schottky-circuits, series 54S, 64S, 74S, 84S
€48.79
Digital circuits; essential ratings and characteristics for integrated circuit memories
€24.39
Digital circuits; essential ratings and characteristics for integrated circuit microprocessors
Semiconductor devices - Integrated circuits - Part 2-20: Digital integrated circuits - Family specification - Low voltage integrated circuits (IEC 47A/755/CD:2006)
€98.32
High frequency inductive components - Electrical characteristics and measuring methods - Part 1: Nanohenry range chip inductor (IEC 51/881/CD:2006)
€84.58
Semiconductor devices - Part 16-2: Microwave integrated circuits - Frequency prescalers (IEC 60747-16-2:2001 + IEC 47E/296/CD:2006)
€111.40
Integrated Circuits - Measurement of Electromagnetic Immunity, 150 kHz to 1 GHz - Part 2: Measurement of Radiated Immunity - Tem-Cell and Wideband Tem-Cell Method (IEC 47A/748/CD:2006)
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions; Magnetic probe method (IEC 61967-6:2002); German version EN 61967-6:2002.
€105.42
Integrated circuits; crosstalk between data channels; specifications and terminology; identical with IEC 47A(Secretariat)247
