Standard Test Method for Estimating Electromigration Median Time-To-Failure and Sigma of Integrated Circuit Metallizations [Metric]
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Practice for Measuring Dose Rate Response of Linear Integrated Circuits
Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
Standard Specification for Pure Aluminum (Unalloyed) Source Material for Electronic Thin Film Applications
Practice for Measuring Dose Rate Response of Linear Integrated Circuits [Metric]
Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits [Metric]
Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits
