Standard Guide for Transient Radiation Upset Threshold of Digital Integrated Circuits
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Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric) (Withdrawn 2023)
Standard Practice for Measuring Dose Rate Response of Linear Integrated Circuits (Metric) (Withdrawn 2023)
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Standard Specification for Pure Aluminum (Unalloyed) Source Material for Electronic Thin Film Applications (Withdrawn 2020)
Coatings for loaded printed wire boards (conformal coatings) -- Part 1: Definitions, classification and general requirements
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