Expression of performance gas analyzers Measuring oxygen in utilizing high-temperature electrochemical sensors
€269.00
Gas Analyzers. Expression of performance Paramagnetic oxygen analysers
€316.00
Surface chemical analysis. Secondary-ion mass spectrometry. Method for depth profiling of boron in silicon
€193.00
Surface chemical analysis. Electron spectroscopies. Minimum reporting requirements for peak fitting in X-ray photoelectron spectroscopy
Gas analysis. Preparation of calibration gas mixtures using dynamic methods Critical flow orifices
Surface chemical analysis. Depth profiling. Method for sputter rate determination in X-ray photoelectron spectroscopy. Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
Surface chemical analysis. Surface characterization. Measurement of the lateral resolution of a confocal fluorescence microscope
Surface chemical analysis. Use of Total Reflection X-ray Fluorescence spectroscopy in biological and environmental analysis
Surface chemical analysis. Sputter depth profiling. Optimization using layered systems as reference materials
Surface chemical analysis. Electron spectroscopies. Procedures for identifying, estimating and correcting for unintended degradation by X-rays in a material undergoing analysis by X-ray photoelectron spectroscopy
Surface chemical analysis. Determination of surface elemental contamination on silicon wafers by total-reflection X-ray fluorescence (TXRF) spectroscopy
Surface chemical analysis. Vocabulary General terms and used in spectroscopy
€404.00
Surface chemical analysis. Vocabulary Terms used in scanning-probe microscopy
€374.00
Expression of performance gas analyzers Photometric
Surface chemical analysis. Glow discharge optical emission spectrometry (GD-OES). Introduction to use
