Laboratory glassware — Petri dishes
€77.00
Approaches for the production of reference materials with qualitative properties
€208.00
Guidance for the production of pure organic substance certified reference materials
Surface chemical analysis — Sputter depth profiling — Optimization using layered systems as reference materials
€115.00
Surface chemical analysis — Depth profiling — Method for sputter rate determination in X-ray photoelectron spectroscopy, Auger electron spectroscopy and secondary-ion mass spectrometry sputter depth profiling using single and multi-layer thin films
€155.00
Reference materials — Contents of certificates, labels and accompanying documentation
Reference materials — Requirements and recommendations for use
Reference materials — Approaches for characterization and assessment of homogeneity and stability
€261.00
Surface chemical analysis — Atomic force microscopy — Guideline for restoration procedure for atomic force microscopy images dilated by finite probe size
Surface chemical analysis — Depth profiling — Measurement of sputtered depth
Surface chemical analysis — Secondary-ion mass spectrometry — Determination of relative sensitivity factors from ion-implanted reference materials
€51.00
Surface chemical analysis — Secondary ion mass spectrometry — Linearity of intensity scale in single ion counting time-of-flight mass analysers
Surface chemical analysis — X-ray photoelectron spectroscopy — Reporting of methods used for charge control and charge correction
Microbeam analysis — Electron probe microanalysis — Guidelines for the determination of experimental parameters for wavelength dispersive spectroscopy
Surface chemical analysis — Glow discharge optical emission spectrometry (GD-OES) — Introduction to use
