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17/30366375 DC:2017
BS IEC 62373-1. Semiconductor devices. Bias-temperature stability test for metal-oxide semiconductor field-effect transistors (MOSFET) Part 1. Fast BTI Test method
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Summary
Transistors;Metal oxide semiconductors;Electronic equipment and components;Temperature;Semiconductors;Voltage measurement;Semiconductor devices;Testing conditions
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 11/30/2017 |
| Page Count | 16 |
| Themes | Testing conditions |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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