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23/30456515 DC:2023
BS ISO 5618-2. Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for GaN crystal surface defects Part 2. Method of determining the etch pit density
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Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 10/09/2023 |
| Page Count | 34 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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