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24/30479937 DC:2024
BS ISO 25498 Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
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Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 06/07/2024 |
| Page Count | 49 |
| Themes | Optical instruments |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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