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24/30492188 DC:2024
Draft BS EN 63378-6 ED1. Thermal standardization on semiconductor packages Part 6. resistance and capacitance model for transient temperature prediction at junction measurement points
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Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 04/30/2024 |
| Page Count | 32 |
| Themes | Capacitance measurement |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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