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24/30500239 DC:2024
BS EN IEC 62047-52 Semiconductor devices. Micro-electromechanical devices Part 52. Biaxial tensile testing method for stretchable MEMS
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Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 09/13/2024 |
| Page Count | 15 |
| Themes | Semiconductor technology |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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