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25/30513804 DC:2025
Draft BS IEC 63581-1 Semiconductor devices. The recognition criteria of defects in polished indium phosphide wafers Part 1. Classification
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Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 03/25/2025 |
| Page Count | 30 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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