ASTM E1127-91(1997)
Superseded , Reaffirmed Standard
Historical

ASTM E1127-91(1997)

Standard Guide for Depth Profiling in Auger Electron Spectroscopy
Most recent standard

Summary

1.1 This guide covers procedures used for depth profiling in Auger electron spectroscopy.

1.2 Guidelines are given for depth profiling by the following:

Section Ion Sputtering 6 Angle Lapping and Cross-Sectioning 7 Mechanical Cratering 8 Nondestructive Depth Profiling 9

1.3 This standard does not purport to address all of the safety problems, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.

Technical characteristics

Publisher American Society for Testing and Materials (ASTM International)
Publication Date 01/01/1991
Confirmation Date 09/10/1997
Collection
Page Count 4
Themes Physicochemical methods of analysis
EAN ---
ISBN ---
Weight (in grams) ---
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