Superseded
, Reaffirmed
Standard
Historical
ASTM E431-96(2002) (R1996)
Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices
Summary
1.1 This guide provides illustrations of radiographs of semiconductors and related devices. Low powered transistors (through the TO-11 case configuration), diodes, low-power rectifiers, power devices, and integrated circuits are illustrated with common assembly features. Particular areas of construction are featured for these devices detailing critical points of design or assembly.
1.2 This standard does not purport to address all of the safety concerns, if any, associated with its use. It is the responsibility of the user of this standard to establish appropriate safety and health practices and determine the applicability of regulatory limitations prior to use.
Technical characteristics
| Publisher | American Society for Testing and Materials (ASTM International) |
| Publication Date | 12/10/1996 |
| Confirmation Date | 12/10/1996 |
| Collection | |
| Page Count | 7 |
| Themes | Semi-conductor devices in general |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
Replaces
10/12/1996
Superseded
Historical
Previous versions
10/12/1996
Superseded
, Reaffirmed
Historical
10/12/1996
Superseded
Historical
10/12/1996
Superseded
, Reaffirmed
Historical
10/12/1996
Superseded
, Reaffirmed
Historical
10/12/1996
Superseded
, Reaffirmed
Historical
10/12/1996
Active
, Reaffirmed
Most Recent