Withdrawn
Standard
Most Recent
ASTM F1032-91
Guide for Measuring Time-Dependant Total-Dose Effects in Semiconductor Devices Exposed to Pulsed Ionizing Radiation (Withdrawn 1994)
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Technical characteristics
| Publisher | American Society for Testing and Materials (ASTM International) |
| Publication Date | 09/10/2024 |
| Cancellation Date | 12/15/1994 |
| Collection | |
| Page Count | 3 |
| Themes | Semi-conductor devices in general |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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