Superseded
Standard
Historical
ASTM F121-83
Test Method for Interstitial Atomic Oxygen Content of Silicon by Infrared Absorption
No description.
Technical characteristics
| Publisher | American Society for Testing and Materials (ASTM International) |
| Publication Date | 09/10/2024 |
| Collection | |
| Page Count | 0 |
| Themes | Semiconducting materials |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
No products.
Previous versions
10/09/2024
Superseded
Historical
01/01/1983
Withdrawn
Most Recent