ASTM F416-94
Withdrawn Standard
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ASTM F416-94

Test Method for Detection of Oxidation Induced Defects in Polished Silicon Wafers (Withdrawn 1998)
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Technical characteristics

Publisher American Society for Testing and Materials (ASTM International)
Publication Date 09/10/2024
Collection
Page Count 11
Themes Semiconducting materials
EAN ---
ISBN ---
Weight (in grams) ---
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