Withdrawn
, Reaffirmed
Standard
Most Recent
ASTM F532-81(1987)e1
Test Methods for Measuring Width of Defects in Optical Surfaces, Using Nomarski Differential Microscopy (Withdrawn 1994)
No description.
Technical characteristics
| Publisher | American Society for Testing and Materials (ASTM International) |
| Publication Date | 01/01/1981 |
| Confirmation Date | 01/01/1987 |
| Cancellation Date | 11/15/1994 |
| Collection | |
| Page Count | 8 |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
Replaces
01/01/1981
Superseded
Historical
Previous versions
01/01/1981
Superseded
Historical
01/01/1981
Withdrawn
, Reaffirmed
Most Recent