Withdrawn
Standard
Most Recent
ASTM F632-90
Test Method for Measuring Small-Signal Comon Emitter Current Gain of Transistors at High Frequencies (Withdrawn 1995)
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Technical characteristics
| Publisher | American Society for Testing and Materials (ASTM International) |
| Publication Date | 09/10/2024 |
| Cancellation Date | 04/15/1995 |
| Collection | |
| Page Count | 6 |
| Themes | Transistors |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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Previous versions
10/09/2024
Withdrawn
Most Recent