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Standard
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ASTM F775-88
Test Method for Wafer and Slice Flatness by Interferometric (Withdrawn 1991)
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Technical characteristics
| Publisher | American Society for Testing and Materials (ASTM International) |
| Publication Date | 09/10/2024 |
| Cancellation Date | 06/29/1990 |
| Collection | |
| Page Count | 7 |
| Themes | Semiconducting materials |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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Previous versions
10/09/2024
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