Withdrawn
Standard
Most Recent
BS CECC 00013:1985
Harmonized system of quality assessment for electronic components: basic specification: scanning electron microscope inspection of semiconductor dice
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Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 08/30/1985 |
| Cancellation Date | 11/04/2009 |
| Page Count | 24 |
| Themes | Integrated circuits |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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