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BS CECC 50000:1987
Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices
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Summary
Electrical measurement;Orientation;Heat of activation;Inspection;Accelerated testing;Capacitance measurement;Breakdown voltage;Sampling methods;Quality assurance systems;Transistors;Marking;Semiconductor diodes;Capability approval;Electrical testing;Test equipment;Semiconductor rectifiers;Thyristors;Circuits;Designations;Testing conditions;Acceptance (approval);Thermal testing;Noise (spurious signals);Mechanical testing;Approval testing;Electronic equipment and components;Environmental testing;Qualification approval;Performance testing;Semiconductor devices;Voltage measurement;Transient voltages;Current measurement;Colour codes;Visual inspection (testing);Power measurement (electric);Statistical quality control;Assessed quality;Specification (approval);Endurance testing;Quality control;Leak tests
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 10/30/1987 |
| Page Count | 96 |
| Themes | Leak tests |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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