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BS CECC 90112:1987
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS read/write dynamic memories silicon monolithic circuits
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Summary
Circuits;Integrated circuits;Digital circuits;Quality assurance systems;Electronic equipment and components;Computer storage devices;Inspection;Statistical quality control;Approval testing;Assessed quality;Electronic storage;Digital integrated circuits;Semiconductor storage;Integrated memory circuits;Specification (approval);Semiconductor devices;Qualification approval;Quality control;Silicon;Detail specification;Metal oxide semiconductors;Direct-access storage;Testing conditions;Monolithic integrated circuits
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 08/15/1987 |
| Page Count | 20 |
| Themes | Monolithic integrated circuits |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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