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BS EN 13925-1:2003
Non-destructive testing. X-ray diffraction from polycrystalline and amorphous materials General principles
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Summary
Amorphous state;Bulk materials;X-ray analysis;Crystallography;Particulate materials;Non-destructive testing;Thin films;X-ray diffraction analysis
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 03/20/2003 |
| Page Count | 16 |
| Themes | X-ray diffraction analysis |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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