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BS EN 153000:1998
Harmonized system of quality assessment for electronic components. Generic specification: discrete pressure contact power semiconductor devices (qualification approval)
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Summary
Electrical testing;Encapsulated;Non-destructive testing;Rectifier diodes;Conformity;Environmental testing;Approval testing;Assessed quality;Endurance testing;Dimensions;Quality assurance;Marking;Detail specification;Semiconductor devices;Electronic equipment and components;Visual inspection (testing);Thyristors;Quality assurance systems;Leak tests;Transistors;Qualification approval
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 07/15/1998 |
| Page Count | 30 |
| Themes | Qualification approval |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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