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BS EN 60444-2:1997
Measurement of quartz crystal unit parameters Phase offset method for measurement motional capacitance units
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Summary
Piezoelectric devices;Resonators;Capacitance;Capacitance measurement;Circuit networks;Electrical wave measurement;Phase measurement (electric);Electrical measurement;Dielectric properties;Wave properties and phenomena;Crystal resonators;Dielectric devices;Resonant frequency;Circuits;Frequencies;Frequency measurement;Quartz;Mathematical calculations;Errors
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 09/15/1993 |
| Page Count | 16 |
| Themes | Errors |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
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