Superseded
Standard
Historical
BS EN 60749-10:2002
Semiconductor devices. Mechanical and climatic test methods shock
Preview
Summary
Integrated circuits;Destructive testing;Electronic equipment and components;Mechanical shock;Environmental testing;Climate;Mechanical testing;Impact testing;Semiconductor devices
Technical characteristics
| Publisher | British Standards Institution (BSI) |
| Publication Date | 09/17/2002 |
| Cancellation Date | 01/18/2023 |
| Page Count | 8 |
| Themes | Semiconductor devices |
| EAN | --- |
| ISBN | --- |
| Weight (in grams) | --- |
No products.
Previous versions
17/09/2002
Superseded
Historical